"High-speed absolute three-dimensional shape measurement using three binary dithered patterns," Opt. Express, (2014)

[69]  W. Lohry* and S. Zhang, "High-speed absolute three-dimensional shape measurement using three binary dithered patterns," Opt. Express 22(22), 26752-26762, 2014 (Cover feature) (Image of the week of Nov. 22, 2014, OSA Optics InfoBase); doi: 10.1364/OE.22.026752

Abstract

This paper describes a method to reconstruct high-speed absolute three-dimensional (3D) geometry using only three encoded 1-bit binary dithered patterns. Because of the use of 1-bit binary patterns, high-speed 3D shape measurement could also be achieved. By matching the right camera image pixel to the left camera pixel in the object space rather than image space, robust correspondence can be established. Experiments demonstrate the robustness of the proposed algorithm and the potential to achieve high-speed 3D shape measurements.