"Microscopic structured light 3D profilometry: binary defocusing technique VS sinusoidal fringe projection," Opt. Laser Eng., (2016)

[92] B. Li and S. Zhang, "Microscopic structured light 3D profilometry: binary defocusing technique VS sinusoidal fringe projection, " Opt. Laser Eng. 96, 117–123, (2017); doi: 10.1016/j.optlaseng.2016.06.009

Abstract

This paper compares the binary defocusing technique with conventional sinusoidal fringe projection under two different 3D microscopic profilometry systems: 1) both camera and projector use telecentric lenses, and 2) only camera uses a telecentric lens. Our simulation and experiments found that the binary defocusing technique is superior to the traditional sinusoidal fringe projection method by improving the measurement resolution approximately 19%. Finally, by taking the speed advantage of the binary defocusing technique, we presented a high-speed (500 Hz) and high-resolution (1600 X 1200) 3D microscopic profilometry system that could reach kHz.