“Absolute three-dimensional shape measurement with two-frequency square binary patterns,” Appl. Opt., (2017)
/C. Jiang and S. Zhang, “Absolute three-dimensional shape measurement with two-frequency square binary patterns,” Appl. Opt., 56(31), 8710-8718 (2017); doi:10.1364/AO.56.008710
Abstract
This paper presents a novel method to achieve absolute three-dimensional (3D) shape measurement solely using square binary patterns. This method uses six patterns: three low-frequency phase-shifted patterns and three phase-shifted high-frequency patterns. The phase obtained from low-frequency phase temporally unwraps the phase obtained from high-frequency patterns. The projector is defocused such that the high-frequency patterns produce high-quality phase, but the phase retrieved from low-frequency patterns has large harmonic error that fails two-frequency temporal phase unwrapping process. In this paper, we develop a computational framework to address the challenge. The proposed computational framework includes four major approaches to alleviate the harmonic error problem: i) use more than one period of low-frequency patterns enabled by geometric constraint-based phase unwrapping method; ii) artificially apply a large Gaussian filter to low frequency patterns before phase computation; iii) create an error lookup table (LUT) to compensate for harmonic error; and iv) develop a boundary error correction method to alleviate problems associated with filtering. Both simulation and experimental results demonstrated the success of the proposed method.